NDLI: Measuring reliability growth of software by considering fault dependency, debugging time Lag functions and irregular fluctuation

Content Provider	ACM Digital Library
Author	Singh, V. B. Kapur, P. K. Tandon, Abhishek
Abstract	The progress of software testing is influenced by various uncertainty factors like effort expenditure, skill of test personal, testing tool, defect density, irregular state of open source project, and irregular state of software fault-report phenomena on the bug tracking system. Hence, there is an irregular fluctuation in fault detection/removal rate during testing phase. In software, the independence of failures can hardly be assumed and dependency of faults can also be considered as one of the factor for getting irregular fluctuation. In Literature, various software reliability growth models have been developed by considering fault dependency with various debugging time lag functions. But, none of the models have incorporated irregular fluctuation in their fault detection rate. Therefore, in this paper fault dependency based software reliability growth models have been developed by applying an It ∧o type Stochastic Differential Equations in order to incorporate (i) the irregular fluctuation in the fault detection process due to various uncertainty factor during testing phase and (ii) irregular state of software fault-report phenomena on the bug tracking system. The proposed stochastic differential equation based fault dependency models have been validated using (i) open source software fault count data where software fault-report phenomena on the bug tracking system keep an irregular state and (ii) a fault counting data with minor, major and critical faults. The proposed models have been compared with the existing fault dependency models. Various comparison criteria results for goodness of fit have also been presented in the paper.
Starting Page	1
Ending Page	11
Page Count	11
File Format	PDF
ISSN	01635948
DOI	10.1145/1764810.1764831
Journal	ACM SIGSOFT Software Engineering Notes (SOEN)
Volume Number	35
Issue Number	3
Language	English
Publisher	Association for Computing Machinery (ACM)
Publisher Date	1979-04-01
Publisher Place	New York
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Defect density Fault dependency Open source software (oss) Stochastic differential equations (sde)
Content Type	Text
Resource Type	Article

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