NDLI: A concept analysis inspired greedy algorithm for test suite minimization

Content Provider	ACM Digital Library
Author	Tallam, Sriraman Gupta, Neelam
Abstract	Software testing and retesting occurs continuously during the software development lifecycle to detect errors as early as possible and to ensure that changes to existing software do not break the software. Test suites once developed are reused and updated frequently as the software evolves. As a result, some test cases in the test suite may become redundant as the software is modified over time since the requirements covered by them are also covered by other test cases. Due to the resource and time constraints for re-executing large test suites, it is important to develop techniques to minimize available test suites by removing redundant test cases. In general, the test suite minimization problem is NP complete. In this paper, we present a new greedy heuristic algorithm for selecting a minimal subset of a test suite T that covers all the requirements covered by T. We show how our algorithm was inspired by the concept analysis framework. We conducted experiments to measure the extent of test suite reduction obtained by our algorithm and prior heuristics for test suite minimization. In our experiments, our algorithm always selected same size or smaller size test suite than that selected by prior heuristics and had comparable time performance.
Starting Page	35
Ending Page	42
Page Count	8
File Format	PDF
ISSN	01635948
DOI	10.1145/1108768.1108802
Journal	ACM SIGSOFT Software Engineering Notes (SOEN)
Volume Number	31
Issue Number	1
Language	English
Publisher	Association for Computing Machinery (ACM)
Publisher Date	1979-04-01
Publisher Place	New York
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Concept analysis Test cases Test suite minimization Testing requirements
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

A concept analysis inspired greedy algorithm for test suite minimization

ABSTRACT A Concept Analysis Inspired Greedy Algorithm for Test Suite Minimization

Test suite reduction for mutation testing based on formal concept analysis

An assimilated approach of concept analysis and particle swarm optimization algorithm for effective test suite minimization

A prolific approach for automated generation of test cases from informal requirements

Minimizing test cases to reduce the cost of regression testing

Improving Fault Detection Capability by Selectively Retaining Test Cases during Test Suite Reduction

DIV-TBAT algorithm for test suite reduction in software testing

Applying Concept Analysis to User-Session-Based Testing of Web Applications

A concept analysis inspired greedy algorithm for test suite minimization

Similar Documents

A concept analysis inspired greedy algorithm for test suite minimization

ABSTRACT A Concept Analysis Inspired Greedy Algorithm for Test Suite Minimization

Test suite reduction for mutation testing based on formal concept analysis

An assimilated approach of concept analysis and particle swarm optimization algorithm for effective test suite minimization

A prolific approach for automated generation of test cases from informal requirements

Minimizing test cases to reduce the cost of regression testing

Improving Fault Detection Capability by Selectively Retaining Test Cases during Test Suite Reduction

DIV-TBAT algorithm for test suite reduction in software testing

Applying Concept Analysis to User-Session-Based Testing of Web Applications

A concept analysis inspired greedy algorithm for test suite minimization