NDLI: Compositional dynamic test generation

Content Provider	ACM Digital Library
Author	Godefroid, Patrice
Abstract	Dynamic test generation is a form of dynamic program analysis that attempts to compute test inputs to drive a program along a specific program path. Directed Automated Random Testing, or DART for short, blends dynamic test generation with model checking techniques with the goal of systematically executing all feasible program paths of a program while detecting various types of errors using run-time checking tools (like Purify, for instance). Unfortunately, systematically executing all feasible program paths does not scale to large, realistic programs.This paper addresses this major limitation and proposes to perform dynamic test generation compositionally, by adapting known techniques for interprocedural static analysis. Specifically, we introduce a new algorithm, dubbed SMART for Systematic Modular Automated Random Testing, that extends DART by testing functions in isolation, encoding test results as function summaries expressed using input preconditions and output postconditions, and then re-using those summaries when testing higher-level functions. We show that, for a fixed reasoning capability, our compositional approach to dynamic test generation (SMART) is both sound and complete compared to monolithic dynamic test generation (DART). In other words, SMART can perform dynamic test generation compositionally without any reduction in program path coverage. We also show that, given a bound on the maximum number of feasible paths in individual program functions, the number of program executions explored by SMART is linear in that bound, while the number of program executions explored by DART can be exponential in that bound. We present examples of C programs and preliminary experimental results that illustrate and validate empirically these properties.
Starting Page	47
Ending Page	54
Page Count	8
File Format	PDF
ISSN	03621340 15581160
DOI	10.1145/1190215.1190226
Journal	ACM SIGPLAN Notices (SIGP)
Volume Number	42
Issue Number	1
Language	English
Publisher	Association for Computing Machinery (ACM)
Publisher Date	1983-05-01
Publisher Place	New York
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Software testing Compositional program analysis Scalability Automatic test generation Program verification
Content Type	Text
Resource Type	Article
Subject	Computer Graphics and Computer-Aided Design Software

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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