NDLI: DRAM errors in the wild (CACM, Vol. 54, Issue. 2)

Content Provider	ACM Digital Library
Author	Weber, Wolf-Dietrich Pinheiro, Eduardo Schroeder, Bianca
Abstract	Errors in dynamic random access memory (DRAM) are a common form of hardware failure in modern compute clusters. Failures are costly both in terms of hardware replacement costs and service disruption. While a large body of work exists on DRAM in laboratory conditions, little has been reported on real DRAM failures in large production clusters. In this paper, we analyze measurements of memory errors in a large fleet of commodity servers over a period of 2.5 years. The collected data covers multiple vendors, DRAM capacities and technologies, and comprises many millions of dual in-line memory module (DIMM) days. The goal of this paper is to answer questions such as the following: How common are memory errors in practice? What are their statistical properties? How are they affected by external factors, such as temperature and utilization, and by chip-specific factors, such as chip density, memory technology, and DIMM age? We find that DRAM error behavior in the field differs in many key aspects from commonly held assumptions. For example, we observe DRAM error rates that are orders of magnitude higher than previously reported, with 25,000--70,000 errors per billion device hours per Mb and more than 8% of DIMMs affected by errors per year. We provide strong evidence that memory errors are dominated by hard errors, rather than soft errors, which previous work suspects to be the dominant error mode. We find that temperature, known to strongly impact DIMM error rates in lab conditions, has a surprisingly small effect on error behavior in the field, when taking all other factors into account. Finally, unlike commonly feared, we do not observe any indication that newer generations of DIMMs have worse error behavior.
Starting Page	100
Ending Page	107
Page Count	8
File Format	PDF
ISSN	00010782 15577317
DOI	10.1145/1897816.1897844
Journal	Communications of the ACM (CACM)
Volume Number	54
Issue Number	2
Language	English
Publisher	Association for Computing Machinery (ACM)
Publisher Date	2005-08-01
Publisher Place	New York
Access Restriction	One Nation One Subscription (ONOS)
Content Type	Text
Resource Type	Article
Subject	Computer Science Computer Science

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
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3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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