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  1. Journal on Emerging Technologies in Computing Systems (JETC)
  2. ACM Journal on Emerging Technologies in Computing Systems (JETC) : Volume 5
  3. Issue 2, July 2009
  4. Defects and faults in QCA-based PLAs
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ACM Journal on Emerging Technologies in Computing Systems (JETC) : Volume 13
ACM Journal on Emerging Technologies in Computing Systems (JETC) : Volume 12
ACM Journal on Emerging Technologies in Computing Systems (JETC) : Volume 11
ACM Journal on Emerging Technologies in Computing Systems (JETC) : Volume 10
ACM Journal on Emerging Technologies in Computing Systems (JETC) : Volume 9
ACM Journal on Emerging Technologies in Computing Systems (JETC) : Volume 8
ACM Journal on Emerging Technologies in Computing Systems (JETC) : Volume 7
ACM Journal on Emerging Technologies in Computing Systems (JETC) : Volume 6
ACM Journal on Emerging Technologies in Computing Systems (JETC) : Volume 5
Issue 4, November 2009
Issue 3, August 2009
Issue 2, July 2009
Introduction to special section: Best of NANOARCH 2008
Low-power FinFET circuit synthesis using multiple supply and threshold voltages
Defects and faults in QCA-based PLAs
Scan-chain design and optimization for three-dimensional integrated circuits
Efficient parallel testing and diagnosis of digital microfluidic biochips
Low-overhead defect tolerance in crossbar nanoarchitectures
Issue 1, January 2009
ACM Journal on Emerging Technologies in Computing Systems (JETC) : Volume 4
ACM Journal on Emerging Technologies in Computing Systems (JETC) : Volume 3
ACM Journal on Emerging Technologies in Computing Systems (JETC) : Volume 2
ACM Journal on Emerging Technologies in Computing Systems (JETC) : Volume 1

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Defects and faults in QCA-based PLAs

Content Provider ACM Digital Library
Author Crocker, Michael Hu, Xiaobo Sharon Niemier, Michael
Copyright Year 2009
Abstract Defect tolerance will be critical in any system with nanoscale feature sizes. This article examines some fundamental aspects of defect tolerance for a reconfigurable system based on Quantum-dot Cellular Automata (QCA). We analyze a novel, QCA-based, Programmable Logic Array (PLA) structure, develop an implementation independent fault model, and discuss how expected defects and faults might affect yield. Within this context, we introduce techniques for mapping Boolean logic functions to a defective QCA-based PLA. Simulation results show that our new mapping techniques can achieve higher yields than existing techniques.
Starting Page 1
Ending Page 27
Page Count 27
File Format PDF
ISSN 15504832
e-ISSN 15504840
DOI 10.1145/1543438.1543441
Journal ACM Journal on Emerging Technologies in Computing Systems (JETC)
Volume Number 5
Issue Number 2
Language English
Publisher Association for Computing Machinery (ACM)
Publisher Date 2009-07-01
Publisher Place New York
Access Restriction One Nation One Subscription (ONOS)
Subject Keyword Nanotechnology Defects Faults Logic mapping Quantum-dot cellular automata
Content Type Text
Resource Type Article
Subject Electrical and Electronic Engineering Hardware and Architecture Nanoscience and Nanotechnology Software
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