Localization of An Element of Interest By Xrf Analysis of Different Inspection Volumes

Content Provider	The Lens
Related Links	https://www.lens.org/lens/patent/011-969-212-677-610/frontpage
Language	English
Publisher Date	2019-10-23
Access Restriction	Open
Alternative Title	Lokalisierung Eines Elements Von Interesse Durch Röntgenfluoreszenz-analyse Verschiedener Inspektionsvolumen Localisation D'un Élément D'intérêt Par Analyse Xrf De Différents Volumes D'inspection
Content Type	Text
Resource Type	Patent
Date Applied	2010-04-30
Agent	Boult Wade Tennant Llp
Applicant	Thermo Scient Portable Analytical Instruments Inc
Application No.	10770432
Claim	A method of inspecting a sample by x-ray fluorescence (XRF) analysis, comprising: irradiating a sample (110,110') with a beam of exciting x-rays having energies suitable for causing an element of interest to emit characteristic fluorescent x-rays; detecting the fluorescent x-rays emitted from a first inspection volume (31 0,430,570) located at least partially in the sample (110,110') and measuring a first intensity of the detected fluorescent x-rays emitted from the first inspection volume (310,430,570); detecting the fluorescent x-rays emitted from a second inspection volume (320,440,580) located at least partially in the sample (110,110') and measuring a second intensity of the detected fluorescent x-rays emitted from the second inspection volume (320,440,580), wherein the first inspection volume (310,430,570) overlaps with and is non-identical to the second inspection volume (320,440,580); comparing the first intensity to the second intensity; and determining a location of the element of interest based on the comparison; characterized in that : the first inspection volume (310,430,570) extends to a coating layer portion (410) and a bulk portion (420) of the sample (110,110') and the second inspection volume (320,440,580) extends only to a bulk portion (420) of the sample (110,110'). The method of claim 1, further comprising a step of controllably changing between the first and the second inspection volumes (310,430,320,440) by moving an exciting x-ray beam collimator (112) between a first position and a second position, to vary the collimation of the exciting x-rays. The method of claim 1, further comprising a step of controllably changing between the first and the second inspection volumes (310,430,320,440) by moving a fluoresced x-ray beam collimator (120) between a first and a second position to vary the collimation of the fluoresced x-rays. The method of claim 1, wherein the first inspection volume (310,430) is defined by positioning each of an exciting x-ray beam collimator (112) and a fluoresced x-ray beam collimator (120) in a first position, and wherein the second inspection volume (320,440) is defined by positioning each of the exciting x-ray beam collimator (112) and the fluoresced x-ray beam collimator (120) in a second position, the method further comprising controllably changing between the first and the second inspection volumes (310,430,320,440) by moving the exciting x-ray beam collimator (112) and the fluoresced x-ray beam collimator (120) between their first and second positions. The method of claim 1, further comprising a step of controllably changing between the first and second inspection volumes (570,580) by moving an eclipser (510) between first and second positions to vary the degree of blocking of the exciting and fluorescing x-rays. The method of claim 1, further comprising a step of deriving a concentration of the element of interest in the determined location. The method of claim 1, further comprising a step of comparing a ratio of the intensities of the characteristic x-rays of the element of interest emitted from the first inspection volume, with the intensities of the characteristic x-rays of the element of interest emitted from the second inspection volume, with an empirically derived calibration ratio. The method of claim 1, wherein the element of interest is lead. An XRF analyzer (100), comprising: an x-ray source (105) for directing a beam of exciting x-rays onto a sample (110') to cause an element of interest to emit characteristic fluorescent x-rays; a detector (117) positioned to receive fluorescent x-rays from an inspection volume and to responsively produce detection signals; an actuator (115) for controllably changing the inspection volume; and a programmable controller (135) having logic for operating the actuator (115) to define a first inspection volume (430), measuring a first intensity of the detected fluorescent x-rays emitted from the first inspection volume (430), operating the actuator (115) to define a second inspection volume (440), measuring a second intensity of the detected fluorescent x-rays emitted from the second inspection volume (440), and comparing the first intensity to the second intensity to determine a location of the element of interest; wherein the actuator (115) is coupled to an exciting beam collimator structure (112) movable between first and second positions, and wherein moving the exciting beam collimator structure (112) between first and second positions varies the collimation of the exciting x-rays to thereby change the inspection volume; wherein the first inspection volume (430) overlaps with and is non-identical to the second inspection volume (440); and wherein the first inspection volume (430) extends to a coating layer portion (410) and a bulk portion (420) of the sample (110') and the second inspection volume (440) extends only to a bulk portion (420) of the sample (110'). An XRF analyzer (100), comprising: an x-ray source (105) for directing a beam of exciting x-rays onto a sample (110') to cause an element of interest to emit characteristic fluorescent x-rays; a detector (117) positioned to receive fluorescent x-rays from an inspection volume and to responsively produce detection signals; an actuator (130) for controllably changing the inspection volume; and a programmable controller (135) having logic for operating the actuator (130) to define a first inspection volume (430), measuring a first intensity of the detected fluorescent x-rays emitted from the first inspection volume (430), operating the actuator (130) to define a second inspection volume (440), measuring a second intensity of the detected fluorescent x-rays emitted from the second inspection volume (440), and comparing the first intensity to the second intensity to determine a location of the element of interest; wherein the actuator (130) is coupled to a fluoresced beam collimator structure (120) movable between first and second positions, and wherein moving the fluoresced beam collimator structure (120) between first and second positions varies the collimation of the fluorescent x-rays to thereby change the inspection volume; wherein the first inspection volume (430) overlaps with and is non-identical to the second inspection volume (440); and wherein the first inspection volume (430) extends to a coating layer portion (410) and a bulk portion (420) of the sample (110') and the second inspection volume (440) extends only to a bulk portion (420) of the sample (110'). An XRF analyzer (100), comprising: an x-ray source (105) for directing a beam of exciting x-rays onto a sample (110') to cause an element of interest to emit characteristic fluorescent x-rays; a detector (117) positioned to receive fluorescent x-rays from an inspection volume and to responsively produce detection signals; an actuator (520) for controllably changing the inspection volume; and a programmable controller (135) having logic for operating the actuator (520) to define a first inspection volume (570), measuring a first intensity of the detected fluorescent x-rays emitted from the first inspection volume (570), operating the actuator (520) to define a second inspection volume (580), measuring a second intensity of the detected fluorescent x-rays emitted from the second inspection volume (580), and comparing the first intensity to the second intensity to determine a location of the element of interest; wherein the actuator (520) is coupled to an eclipser structure (510) movable between first and second positions, and wherein moving the eclipser structure (510) between first and second positions varies a degree of blocking of the exciting x-rays and the fluorescent x-rays to thereby change the inspection volume between said first and said second inspection volumes (570,580); wherein the first inspection volume (570) overlaps with and is non-identical to the second inspection volume (580); and wherein the first inspection volume (570) extends to a coating layer portion (410) and a bulk portion (420) of the sample (110') and the second inspection volume (580) extends only to a bulk portion (420) of the sample (110').
CPC Classification	Investigating Or Analysing Materials By Determining Their Chemical Or Physical Properties
Extended Family	174-804-277-350-884 057-055-626-075-28X 157-571-369-126-467 072-617-223-478-899 192-400-094-635-512 085-377-880-709-003 074-529-623-994-06X 101-389-775-382-113 011-969-212-677-610 043-565-914-835-230
Patent ID	2425234
Inventor/Author	Grodzins Lee
IPC	G01N23/223
Status	Active
Owner	Thermo Scientific Portable Analytical Instruments
Simple Family	174-804-277-350-884 057-055-626-075-28X 072-617-223-478-899 157-571-369-126-467 192-400-094-635-512 085-377-880-709-003 074-529-623-994-06X 101-389-775-382-113 011-969-212-677-610 043-565-914-835-230
CPC (with Group)	G01N23/223 G01N2223/076
Issuing Authority	United States Patent and Trademark Office (USPTO)
Kind	Patent/Patent 1st level of publication/Inventor's certificate