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Method of Manufacturing Photo Masks
| Content Provider | The Lens |
|---|---|
| Abstract | In a method of manufacturing a photo mask for lithography, circuit pattern data are acquired. A pattern density, which is a total pattern area per predetermined area, is calculated from the circuit pattern data. Dummy pattern data for areas having pattern density less than a threshold density are generated. Mask drawing data is generated from the circuit pattern data and the dummy pattern data. By using an electron beam from an electron beam lithography apparatus, patterns are drawn according to the mask drawing data on a resist layer formed on a mask blank substrate. The drawn resist layer is developed using a developing solution. Dummy patterns included in the dummy pattern data are not printed as a photo mask pattern when the resist layer is exposed with the electron beam and is developed. |
| Related Links | https://www.lens.org/lens/patent/010-004-850-048-731/frontpage |
| Language | English |
| Publisher Date | 2019-05-16 |
| Access Restriction | Open |
| Content Type | Text |
| Resource Type | Patent |
| Jurisdiction | United States of America |
| Date Applied | 2018-04-30 |
| Applicant | Taiwan Semiconductor Mfg Co Ltd |
| Application No. | 201815966862 |
| Claim | A method of manufacturing a photo mask for lithography, the method comprising: acquiring circuit pattern data; calculating a pattern density, which is a total pattern area per predetermined area, from the circuit pattern data; generating dummy pattern data for areas having pattern density less than a threshold density; generating mask drawing data from the circuit pattern data and the dummy pattern data; drawing, by using an electron beam from an electron beam lithography apparatus, patterns according to the mask drawing data on a resist layer formed on a mask blank substrate; and developing the drawn resist layer using a developing solution, wherein dummy patterns included in the dummy pattern data are not printed as a photo mask pattern when the resist layer is exposed with the electron beam and is developed. The method of claim 1 , wherein a dose amount of the electron beam for the dummy patterns included in the dummy patterns data is smaller than a dose amount of the electron beam for circuit patterns included in the circuit patterns data. The method of claim 2 , wherein: the dose amount of the electron beam for patterns corresponding to the dummy patterns data is set smaller than a threshold dose amount, and the threshold dose amount is less than a dose amount by which the resist layer forms a pattern by the developing using the developing solution. The method of claim 1 , wherein a size of the dummy patterns is less than a resolution limit of a patterning operation using the electron beam lithography apparatus. The method of claim 1 , wherein the dummy pattern data includes periodically arranged dummy patterns. The method of claim 1 , wherein the dummy pattern data is generated such that a pattern density of the areas after the dummy patterns is provided is in a range from 0.8 times the threshold density to 1.2 times the threshold density. The method of claim 6 , wherein the threshold density is in a range from 20% to 40%. The method of claim 1 , wherein the dummy pattern data is generated such that the dummy patterns are arranged to surround a dense area having a pattern density equal to or greater than the threshold density, within a predetermined distance from the dense area. The method of claim 8 , wherein the predetermined distance is in a range from 100 μm to 5000 μm. The method of claim 1 , wherein the dummy pattern data is generated such that a pattern density of an entirety photo mask after the dummy patterns are provided is within a predetermined range. The method of claim 10 , wherein the predetermined range is a range from 0.8 times the threshold density to 1.2 times the threshold density. The method of claim 10 , wherein the predetermined range is more than 0.5 times the threshold density and less than the threshold density. The method of claim 1 , wherein: a first threshold density and a second threshold density different from the first threshold density are set as threshold densities, the dummy pattern data is generated such that first dummy patterns are arranged to surround a first area having a pattern density equal to or greater than the first threshold density, and second dummy patterns are arranged to surround a second area having a pattern density equal to or greater than the second threshold density, and a pattern density of first dummy patterns is different from a pattern density of second dummy patterns. A photo mask data generating apparatus, comprising: a processor; and a non-transitory computer readable medium storing a program, wherein the program, when executed by the processor, causes the mask data generating apparatus to perform: acquiring circuit pattern data; calculating a pattern density from the circuit pattern data; generating dummy pattern data for areas having pattern density less than a threshold density; generating mask drawing data by combining the circuit pattern data and the dummy pattern data; and outputting the generated mask drawing data to an electron beam lithography apparatus, wherein dummy pattern data includes dummy patterns not printable as a photo mask pattern when a resist layer formed on a mask blank substrate is exposed with an electron beam by an electron beam lithography apparatus and is developed. The mask data generating apparatus of claim 14 , wherein the dummy pattern data is generated such that a pattern density of the areas is in a range from 0.8 times the threshold density to 1.2 times the threshold density. The mask data generating apparatus of claim 14 , wherein the dummy pattern data includes periodically arranged dummy patterns. The mask data generating apparatus of claim 14 , wherein the threshold density is in a range from 20% to 40%. The mask data generating apparatus of claim 14 , wherein the dummy pattern data is generated such that the dummy patterns are arranged to surround a dense area having a pattern density equal to or greater than the threshold density, within a predetermined distance from the dense area. The mask data generating apparatus of claim 18 , wherein the predetermined distance is in a range from 100 μm to 5000 μm on a photo mask. A non-transitory computer readable medium storing a program, wherein the program, when executed by a processor in a mask data generating apparatus, causes the mask data generating apparatus to perform: acquiring circuit pattern data; calculating a pattern density from the circuit pattern data; generating dummy pattern data for areas having pattern density less than a threshold density; generating mask drawing data by combining the circuit pattern data and the dummy pattern data; and outputting the generated mask drawing data to an electron beam lithography apparatus, wherein a size of dummy patterns included in the dummy pattern data is smaller than a resolution limit of a patterning operation using the electron beam lithography apparatus. |
| CPC Classification | PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES; e.g. FOR PRINTING; FOR PROCESSING OF SEMICONDUCTOR DEVICES;MATERIALS THEREFOR;ORIGINALS THEREFOR;APPARATUS SPECIALLY ADAPTED THEREFOR; |
| Extended Family | 193-177-759-894-058 169-421-849-922-341 179-121-215-345-800 164-912-343-960-492 184-683-077-440-425 076-052-248-056-676 132-514-202-446-583 144-704-329-875-88X 010-004-850-048-731 126-752-132-889-982 044-966-022-732-045 165-828-247-855-494 |
| Patent ID | 20190148110 |
| Inventor/Author | Chen Chien-cheng Chen Chia-jen Lee Hsin-chang Chang Shih-ming Shen Tran-hui Ho Yen-cheng Hsu Chen-shao |
| IPC | H01J37/317 G03F1/76 G03F7/20 |
| Status | Active |
| Owner | Taiwan Semiconductor Manufacturing Co. Ltd |
| Simple Family | 193-177-759-894-058 169-421-849-922-341 179-121-215-345-800 164-912-343-960-492 132-514-202-446-583 184-683-077-440-425 076-052-248-056-676 144-704-329-875-88X 010-004-850-048-731 126-752-132-889-982 044-966-022-732-045 165-828-247-855-494 |
| CPC (with Group) | G03F1/36 G03F1/78 G03F7/70441 |
| Issuing Authority | United States Patent and Trademark Office (USPTO) |
| Kind | Patent Application Publication |
