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The measurement of intelligence; an explanation of and a complete guide for the use of the Stanford revision and extension of the Binet-Simon intelligence scale
Content Provider | Internet Archive |
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Author | Terman, Lewis M. (Lewis Madison) |
Organization | Internet Archive |
Language | English |
Publisher | Boston, New York Houghton Mifflin Company |
Publisher Date | 1916-01-01 |
Access Restriction | Open |
Subject Keyword | Binet-Simon Test Intelligence tests Intelligence Tests Stanford-Binet Test Intelligence Tests Medidas De Inteligencia EĢchelle de Stanford-Binet |
Content Type | Text |
Resource Type | Book |